PXI, LXI, & the modular test puzzle: finding the right fit
In this episode of Electronic Specifier Insights, Managing Editor Paige West speaks with Tom Sarfi, Business Development Manager at Pickering Interfaces, about the key differences and similarities between PXI and LXI. Tom discusses where each platform performs best, the factors engineers should consider when choosing between them, and shares practical insights into their applications. The episode concludes with his expert take on the future of modular instrumentation and where the technology is heading.
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Show Notes
In this episode of Electronic Specifier Insights, Managing Editor Paige West speaks with Tom Sarfi, Business Development Manager at Pickering Interfaces, about the key differences and similarities between PXI and LXI. Tom discusses where each platform performs best, the factors engineers should consider when choosing between them, and shares practical insights into their applications. The episode concludes with his expert take on the future of modular instrumentation and where the technology is heading.